LOW-FREQUENCY DIELECTRIC RELAXATION IN SILVER STEARATE LAYERS

Figure 4 shows results obtained in samples Zn and ZnFe in the EIS experiments. A relaxation time observed at the low frequency region, for the third day of exposure, denotes

The obtained results from the dielectric characterization in the microwave region, for the modified lead titanate ce- ramics, confirmed the existence of the dielectric

Anomalies in the temperature dependence of the dielectric parameters (f R (characteristic frequency) and the dielectric strength Δε (characteristic of the dispersion)) have

The magnetic loss in the Ni architectures was mainly caused by the natural resonance, while the dielectric relaxation loss was originated from the interfacial relaxation between

The variations of the dielectric constant, the dielectric loss, and AC conductivity with variation in frequency and temperature for YSZ nanoparticles were analyzed. The

In this paper, we report on the fabrication of CaF 2 buer layers on Si using the low energy cluster beam de- position technique and study of its dielectric behaviour..

Dielectric constant and dielectric loss factor for low concentration of ethanol solutions were measured over the microwave frequency from 0.5 to 50 GHz.. The measurements

A Self Emulsifying Drug Delivery System (SMEDDS). An Investigation into the Physico-Chemical Properties of Self-Emulsifying Systems using low frequency Dielectric