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[PENDING] Recovering effective thicknesses and optical properties of copper and copper oxide layers from absorbance measurements

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Figure 1: (a) Presumed structure of copper / copper oxide bilayer. (b) schematic of the electromagnetic model of interaction of light with the copper / copper oxide bilayer.
Table 1: AFM and ellipsometry characterization of the thicknesses of copper and copper oxide
Table 2: Annealing times and temperatures for the thermal treatments (annealing) of each sample of target thickness 10, 30, 50 nm.
Figure 3: (a) Solid lines: real (gray) and imaginary (black) parts of the relative permittivity of copper oxide from[30].
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