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READING RANGE CONSIDERING THE TRANSMITTER LEAK- AGE AND A SIC TECHNIQUE

No documento Defesa de tese de doutorado: Roddy Romero (páginas 147-150)

6.2 READING RANGE CONSIDERING THE TRANSMITTER LEAK-

(referred to the antenna), which, depending on its configuration, may be written as

αiso1=





Icc1+|Γa|2 , single-antenna w/ circulator;

Ccp/Icp+|Γa|2 , single-antenna w/ coupler;

Ia1 , two-antenna;

(6.8)

where Γa represents the voltage reflection coefficient of the reader antenna,Ccpis the coupling factor of the coupler andIcc,IcpandIa represent the isolation factors of the circulator, coupler, and between antennas, respectively.

Alternatively, the noise leakage term can be expressed as Nil= Ptx

αisoF OMr

, (6.9)

where F OMr =αsicSN Rtx is a figure of merit related to the reader [119]. As a result, the maximum reading range calculated from the sensitivity expression obtained from the radar equation (assuming line- of-sight propagation) is equal to

dtn(max)= 4 s

PtxG2aδpol

Sr

λ2RCS

(4π)3 , (6.10)

where Ga is the antenna gain, δpol is an attenuation factor due to polarization mismatch between the antenna and the tag. The superscript tnmakes reference to thetotal noise.

Similar to an analysis made for an RFID chipped system [119], provided a transmitter power level (Ptx), the sensitivity will be deter- mined either by the thermal noise or by the transmitter leakage noise.

When this power is low, the thermal noise is the dominant noise source, thus, the traditional equation from the radar equation can be used.3 However, when it is high, the leakage noise dominates. The transition be- tween both conditions depends onαiso,αsic, andSN Rtx. Moreover, the leakage noise is expected to be more severe in single-antenna monostatic readers, since the isolation factorαisois typically lower, and the reader sensitivity becomes more dependent on the SIC circuit performance (see (6.9)). Therefore, forNith<< Nil, (6.10) is reduced to

dln(max)4 s

F OMaF OMr

SN Ro

λ2RCS

(4π)3 , (6.11)

3Refer to (2.2) in Section 2.1.

where F OMa =αisoδpolG2a is the antenna figure of merit. Here, the superscriptlnemphasizes that this equation considers only theleakage noise.

Equation (6.11) is in agreement with the expression obtained in [119]4. Nevertheless, in chipless RFID tag measurements, not only the transmitter thermal noise must be considered but also its phase noise, since it produces a residual noise after downconversion of the signal backscattered from the tag due to the so-calledrange correlation effect [124]. Then, the phase-noise should be taken into account by including it in the SN Rtx, i.e.,Ntx =Ntxth+Ntxph. This component is equal to the total integrated phase noise within the band of interest

Ntxph=

Z fn+∆f fn

Sph(f)αph(f)df, (6.12) which is dependent on the phase-noise power spectrum of the transmitter signal (Sph(f)) and the range correlation factorαph(f) = 4 sin2(πf τrt), whereτrt is the round-trip delay time of the CW interrogating signal that impinges on the tag.

6.2.2 Leakage signal power analysis

Besides the impact of the transmitter leakage noise, its high-power leakage signal must be analyzed as well. For instance, it is necessary that the downconverted signal is digitized with enough accuracy at the input of the digital processing unit. We can express this requirement by relating the minimum resolvable step of the Analog-to-Digital Converter (ADC) at the end of the receiving chain and the minimum SNR at processing unit:

F SV

2EN OB < GbVtag

pSN Ro(min). (6.13) The left term represents the least significant bit value given by the ratio of the full-scale voltage (F SV) and the effective number of bits (EN OB) of the ADC, and Gb is the baseband voltage gain of the receiver chain (baseband amplifier plus filter).

The maximum achievable value of the baseband gain without saturating the baseband reception chain is limited by the sum of ampli- tudes of the downconverted signals retrieved from the tag (Vtag) and

4For chipped tags,RCS=G2tagηM ODλ4/4π.

transmitter residual leakage signal (Vl) due to the SIC circuit. Typically, the portion due to the tag is very weak compared to the residual leakage signal, soVl+VtagVl. Therefore,

Gb(max)F SV

Vl . (6.14)

Furthermore, it can be stated that

Vl2/Vtag2 =Pil/Pitag, (6.15) where Pil = Ptxisoαsic is the leakage power from the transmitter referred at the antenna, and Pitag is the input power due to the tag backscattering signal deduced from the radar equation. Finally, by substitutingGbandVtagin (6.13) using (6.14) and (6.15), the maximum reading range can be determined from

ddr(max)= 4 s

F OMaαsic4EN OB SN Ro

λ2RCS

(4π)3 , (6.16) where the superscriptdrindicates its relation to thedynamic range.

We should notice that (6.16) is similar to (6.11), both being affected by the SIC attenuation factor. In the case of a reader where SN Rtx>4EN OB, the reading distance would be restricted by the power of the transmitter leakage signal rather than its leakage noise.

At this point, it is important to remark that the downconverted leakage signal is typically not a relevant issue in traditional RFID chipped tags since this signal is downconverted at a different frequency, lower than the backscattering link frequency of the tag. Thus, it could be filtered out before reaching the ADC.

No documento Defesa de tese de doutorado: Roddy Romero (páginas 147-150)