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Mat. Res. vol.6 número1

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Figure 1. Experimental diagram for dielectric characterization using the reflectometric technique: (a), coaxial probe method and (b), coaxial line method with an adapted moving sample holder.
Figure 2 shows the dielectric response of the alumina ceramic obtained at room temperature using the  commer-cial coaxial probe method (Fig
Figure 5. Dielectric response for the PLTM ferroelectric ceramic including the low and high frequency range (100 Hz to 2 GHz), at room temperature.

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