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(1)

nipi Delta-Doping Superlatties for

Amplitude Modulation

C. V.-B. Tribuzy, S.M. Landi, M. P. Pires, R. Butendeih

, P. L. Souza,

Laboratoriode Semiondutores,CentrodeEstudos emTeleomunia~oes,,

PontifiaUniversidadeCatoliadoRiodeJaneiro,

Rua Marqu^esdeS~aoViente225,Riode Janeiro, 22453-900,Brazil

A. C. Bittenourt, G. E.Marques,

Institutode Fsia,UniversidadeFederalde S~aoCarlos,

S~aoCarlos,13565-905 Brazil

and A. B. Henriques

Institutode Fsia,UniversidadedeS~aoPaulo,

S~aoPaulo 05315-970,Brazil

ReeivedonApril23,2001

GaAs/AlGaAsmultiplequantumwellstruturesontainingannipidelta-dopingsuperlattie,where

then-typedopingisinsertedinthequantumwellsandthep-typeinthebarriers,havebeenstudied

indetailtoevaluatetheirpotentialforuseinthefabriationofamplitudemodulators. Itisshown

that C is an adequate p-type dopant for suh strutures, however, little exibility is found in

the growth onditions, inpartiularfor theV to III uxes ratio, for obtainingsuh layers. It is

also observedthat the required balane between n and p type doping levels is not trivial to be

ahievedduetothepreseneofinterfaeholetrapswhosepopulationdependsonthequantumwell

doping onentration. In addition, the observed photoluminesene near-edge emission at room

temperature ours at essentially the same energy as that of an equivalent undoped struture.

Finally,nodeeplevelemissionsareobservedwhihoulddeterioratethedevieperformane.

I Introdution

Reent demands for multiterabit ommuniation

re-quire external amplitudemodulators operatingat low

voltages. Amplitude modulators based on the

Quan-tum Conned Stark Eet (QCSE) in III-V

semion-dutors multiple quantum well (MQW) systems are

suitable for meeting these tehnologial demands and

therefore, muh attention has been devoted to their

development 1;2

. One of the ruial requirements for

eÆientmodulationathighbitratesisthatthehange

in absorption perapplied voltage be aslarge as

possi-ble. In other words, the Stark shift should be

max-imized. The larger the quantum well is, the larger

theStarkshift 3

. However,inreasingthequantumwell

width dereasesthe osillator strength forabsorption.

Thus, aompromiseisimposed. Analternativefor

in-reasing the Stark shift has been proposed by Batty

and Allsopp 4

. Theyhavetheoretiallyshownthat the

introdution of an nipi delta-doping superlattie in a

MQW struture, where the quantum well is

n-delta-doped while the barrier is p-delta-doped, may double

theStark shift.

Ifthenipi-MQWstruturesareexpetedtobeused

inamplitudemodulators somerequirementsshouldbe

fulled. The presene of the nipi delta-doping

super-lattie should not introdue energy levels in the

for-bidden gap,otherwise, in the ON stateof thedevie,

lightould beabsorbed, dramatiallyinreasing

inser-tionlosses. Forappliations in amplitudemodulators,

wheretheMQWsform theativeregionofthedevie,

itisruial that thenetdopingorrespondsto an

un-dopedstruture,sothattheappliedeletrieldis

uni-formly distributed over the entire MQWregion. It is

thereforeessentialto balaneouttheeletronand the

hole onentrations in the delta layers. In this

arti-le,rst,resultsofathoroughinvestigationofC

delta-doping of AlGaAs grown by MOVPE using CBr

4 as

theCsourearepresented. Muh attentionisdevoted

to the hanges in doping level as afuntion of the V

to III uxes ratio, V/III. It is experimentally shown

that only within a small range of this ratio it is

pos-sible to obtain C delta-doped AlGaAs layerswith all

(2)

thepropertiesrequiredforthefabriationofamplitude

modulators. Seond,itisshownthatinGaAs/AlGaAs

nipi-MQW strutures the fundamental optial

transi-tionisbasiallynotshiftedwithrespetto thatofthe

undopedstruture andnooptialtransition belowthe

fundamentalgapatroomtemperatureisobserved.

Fi-nally, transportmeasurementsdemonstrate thatthe p

dopingeÆienyhangeswhenMQWsaregrownwith

n and p dopants in the QWs and in the barriers,

re-spetively. Thisrendersthebalaneofnand pdoping

moredeliateto beahieved.

II Experimental details

All samples were grown by metalorgani vapor phase

epitaxyonanAIX200reatorat630 o

Cand100mbar.

TMGa,TMAl,AsH

3 ,SiH

4

andCBr

4

wereusedasGa,

Al,As,SiandCsoures,respetively. FortheCdoped

layers, on a Cr-doped (100) orientedGaAs substrate,

after a500

Athikundoped GaAsbuer layera2000

AthikAlGaAslayerhomogeneouslydopedwithCwas

deposited. TheAl ontent in the alloyis 28%, as

de-termined by x-ray measurements. In the ase of the

delta-dopedsamples, Cwas introdued during growth

aording to the following sequene. After a 1000

A

thikundopedAlGaAslayerwasgrown,theTMAland

TMGawereswithedofor15seondswhiletheAsH

3

ux was swithed from a high to a low value. Then

the Ga, Al and C soures were swithed on for 2.5

seonds. After this short period these soures were

swithed o for 10 seonds while the AsH

3

ux was

raised to the original high value. At this point, the

TMAlandTMGawereturned onandanother1000

A

thikundopedAlGaAslayerwasgrown. Thearsineux

should besuh thatminimizes Cinorporationduring

growth of the undoped layer and optimizes it in the

doped layer. Thus the AsH

3

ux has to be hanged

during the growth of the delta-doped samples.

Vari-ous V/III and CBr

4

uxes were used for the growth

ofthe samples. Beforeremovingthesamplesfromthe

reator hamber they were all annealed at 600 o

C for

15 minutes in N

2

for removal of H atoms. For the

GaAs/AlGaAs MQW samples, a 300

A GaAs buer

layerwasrstgrownfollowedbyathikAlGaAslayer

whih wasdelta-doped 25

A before the growthof the

MQWlayers. TheMQWstruture onsistsof20

peri-odsof100

AthikGaAsQWs, n-delta-dopedusing Si

intheenter,and50

AthikAlGaAsbarriers,C

delta-doped in the enter. The last barrier is 500

A thik

anditsCdeltalayerwasintrodued25

Afromthelast

grownQW. Growth interruptionwasused to produe

theSidelta-dopedGaAslayers.

Theurrentarrieronentrationandmobilitywere

perature (RT) and at 77 K using an HL 5500

equip-ment. Theapaitanevs. voltage(C-V)proleswere

obtained by the eletrohemial proler PN 4300 to

determine the delta layers loalization both in GaAs

and AlGaAs. The photoluminesene (PL)

measure-ments were arried out with the 514 nm line of an

Ar +

laserforexitation. Thesignalwasdispersedbya

250mmmonohromatoranddetetedbyaGenitrogen

ooledphotodetetor. PLexperimentswereperformed

fortemperaturesbetween20and300K.

III Results and disussion

First, the diÆulties and results involving C

delta-dopedbulk AlGaAs layerswill be addressed, followed

by the results of Si delta-doped GaAs bulk layers.

Then, results on GaAs/AlGaAs MQW ontaining

ei-ther n or p delta-doped layers entered in the QW

and in thebarrier, respetively, will bepresentedand

disussed. Finally, theresultsobtained withthe

nipi-MQWsampleswillbereported andanalysed.

Figure1. Fullwidthathalfmaximum(FWHM)ofthe

a-paitaneversus voltageproles(CV)inunitsoftheBohr

radius(a

B =11.4

A)asafuntionofthearealnethole

on-entration,P2D,inunitsofa 2

B

. Thesolidlineorresponds

to thetheoretialalulations, thesquares referto the

ex-perimentalresultsofthisworkwhile theotherdatapoints

orrespondtodatafromtheliteratureasspeiedbythe

la-bels. TheinsetshowstheCVproleforonesample,where

thesolidlineisthesimulationforanimpurityonnement

equivalent to a gaussianof 5

A widthwhile the sattered

pointsorrespondtotheexperimentaldata.

Thesolid dotsin theinset of Fig. 1represent the

net hole onentration, [P℄, for one typial C

delta-dopedAlGaAssample obtainedbyCVmeasurements.

The CV full width at half maximum (FWHM) is 39

A and the integral of the CV prole gives a value of

1 x 10 12

m 2

for the areal hole onentration 5

. The

(3)

withintheHartreeapproximation,assumingthe

impu-rities follow agaussian distribution of width equalto

5

A, in the same way as it has been previously done

for Si delta-doped InP 6;7

. A single heavy hole

sub-band wastakenintoaountin thealulations,given

that theFermienergyinthestruturesonsideredwas

alwayssmallerthantheenergyseparationbetween

de-oupled heavyandlightholesubbands. Thesolidline

inFig. 1showsthetheoretialCVFWHM(inunitsof

the heavyholeBohrradius, a

B =11.4

A)as afuntion

of the twodimensional holeonentration(in units of

a 2

B

)foranatomiCloalizationof5

A,P

2D

. The

tri-anglesrepresentthesamplesgrownforthiswork,while

the other data points refer to results from the GaAs

literature 8 11

. Points above the solid line orrespond

to aonnementoveraregionwiderthan5

A.

Inorder to obtainsuh narrow onnement of the

Catomsandaontrolledhighdopinglevel,around1x

10 12

m 2

,severalC-dopedlayersweregrownusing

dif-ferentCBr

4

uxesand variousV/III.Fig. 2shows[P℄

as a funtion ofthe CBr

4

ux forthese samples. The

V/III values used are shown in the inset. The solid

symbolsorrespondtodeltalayerswhiletheopenones

orrespondto bulk-doping. Thepointson theY axis,

aretheresidualdopinglevelsahievedforthedierent

V/IIIvalues,meaningCBr

4

uxequalto zero.

Figure 2. Net harge onentration as a funtion of the

CBr4 ux. The solid symbols orrespond to delta-doped

layersandtheopenonestobulk-dopedlayers.TheVtoIII

uxesratiousedforthegrowthofthedierentsamplesare

indiatedinthegure.

One of the highlights of Fig. 2 are the extremely

high doping levels ahievedfor V/III valuesbelow 10

due to themany sites V available forC atoms.

How-ever,astheCBr

4

ux inreases,littleornohangesin

the dopinglevelis observed,meaningthat onehas no

realontroloverthedoping. With suhlowV/III,not

only C from the CBr

4

is inorporated but also from

the TMGa and TMAl. This is the intrinsi doping

regime. Ontheotherextreme,forhighV/III,onlylow

V/III=100,theCresidualdopingisthelowest.

There-fore,this ratiowashosenforthehigh AsH

3

ux used

togrowtheundopedpartsoftheAlGaAslayers.

Comparingthedelta-dopedsampleswiththe

bulk-dopedonesforV/IIIequalto15inFig. 2,oneobserves

the same behaviorof [P℄ with the CBr

4

. For the

re-quireddopinglevelsforthenipi amplitudemodulators

andotherdevies 4;6;12

,[1x10 18

m 3

,5x10 19

m 3

℄,a

verynarrowrangeofV/IIIanbeused. Forthegrowth

rateandT

g

usedinthisinvestigationthisintervalis15

to30,asdepitedinFig.2. Inotherwords,oneshould

keep in mind that despite its advantages, the C

dop-ingofAlGaAsleaveslittleexibilityintermsofgrowth

onditionsforsomedevie appliations.

Bulk GaAs layers delta-doped with Si were grown

tooptimizetheimpurityspatialdistribution. C-V

pro-les were measured and typialFWHM of 65

A were

observed for adoping level of 2.0 x 10 12

m 2

. This

valueis20%belowthetheoretialresolutionpredited

in referenes5 and7, implying in animpurity atomi

loalization ofless than 10

A, omparable to the best

previouslyreportedresults 5;8

.

GaAs/AlGaAsMQWsampleswerethengrown

on-tainingeithern-typedopingintheQWorp-type

dop-inginthebarrierinordertoalibratetheeletronand

holeonentrations. The measuredfree eletron

on-entration per doping plane, N, as a funtion of the

silaneux for100

AthikGaAs QWsshowedalinear

behaviorforaSiH

4

uxbetween0.1and3.5sm. The

mobilityofthesamplesatRTisreduedasthedoping

levelinreases, asexpeted. Essentiallynohangesin

mobility ourwhen the measurementtemperature is

loweredto77K,beausethemobilityislimitedby

ion-izedimpurities. It should be notedthat the n-doping

planeintroduesaV-shapedpotentialwellforeletrons

intheGaAs QW,so thefreeeletronsareloalizedin

the same region as the ionized Si atoms. The same

typesofmeasurementswereperformedin MQWs

on-taining only p-type delta-doping in the enter of the

barriers. Thetwoexternal barriershavehalf the

dop-ing level of the internal ones. The free hole

onen-trationperdopingplane,P,asafuntion oftheCBr

4

uxfortherangebetween2and20sm,alsoshowsa

linearbehavior. TheRTmobilityoftheCdoped

sam-pleshoweveris independent of the CBr

4

ux. In this

ase,thep-typedopingplanesareinthebarrierswhere

theyintrodueaninverted V shaped potential,

never-theless part of the hole density moves into the QWs,

stayingfarfromtheionizedimpurities. Thispointwill

bere-addressedand further disussed. WhennoQWs

arepresent,as in AlGaAsbulk materialhavinga

sin-gle C-doping plane, the mobility is lowerbeause the

holesremainloseto the impurity plane. In addition,

ifthe Hall measurement temperature is loweredto 77

K,ontrarytotheSidelta-dopedMQWs,themobility

(4)

Having obtained the optimized growth onditions

for the MQWs ontainingeither types of doping, the

nipi-MQW samples were grown using the alibration

previuosly made with the purpose of obtaining

essen-tiallyintrinsimaterialwherePandN shouldbeequal.

However, the Hallmeasurements showed that thenet

freearrier onentration was heavily n-type.

Assum-ingthat theatomiinorporationisunhanged,either

theeletrialativityof thep-dopingisreduedinthe

presene of Si atoms in the well or that of n-doping

is improved in the presene of C atoms in the

bar-riers. In tryingto understand this eet, nipi-MQW

sampleswithdierentsilaneuxesweregrownandthe

netfree arrieronentration measuredbyHall eet.

Subtratingthesevaluesfromthosepreditedusingthe

previouslyobtainedalibrationurves,oneobtainsthe

onentration of \lost"free holes whih is graphed in

Fig. 3 as a funtion of the silane ux. One learly

seesthattheonentrationof\lost"freeholesinreases

withtheSiH

4

ux. Moreover,therateofinreaseisthe

same forthe two dierent CBr

4

uxes, if a linear

de-pendeneisassumed,asdepitedbythetwosolidlines

in Fig. 3. In addition, extrapolating for zero silane

ux,onendsthatthedensityofholeslostforthe

un-doped QWs inreaseswiththe CBr

4

ux. Inthease

ofzeroSiH

4

ux,thedierene betweentheCatomi

onentration, measured by SIMS, and the free hole

onentration, measured by Hall, is in full agreement

withthedensityof\lost"holes,showninFig. 3.

Figure3. \Lost" freeholes asafuntionof theSiH4 ux.

Thesevaluesareobtainedfromthesubtrationofthe

mea-surednetfreearrieronentrationfortheMQWstrutures

ontainingannipi Æ-dopingsuperlattie(nipi-MQW)from

thatpreditedbythealibration.

Theinreasein\lost"holeswiththesilaneuxan

beunderstoodasfollows. ThesolidlinesinFig. 4show

ashemeofthepotentialforthenipi-MQWstruture,

whilethedashedandsolidlinesorrespondtothe

dier-entholeprobabilitydensities, F(z)xF(z),aslabeled.

With the presene of a plane of ionized Si atoms the

QWis,infat,dividedintotwohalfQWs. IntheQW

to the fundamental energy level will be peaked loser

totheinterfaes,whilein theaseofanundopedQW,

it will have its maximum in the enter. In addition,

the largertheSi atomi onentration, thedeeper the

V-shaped potential in the QW, and onsequently, the

losertotheinterfaetheholeprobabilitydensitypeak

is. Thus,in thepreseneofholetrapsin theinterfae,

theintrodutionofann-typedopingplanein theQW

willertainlylowertheeÆienyofthep-dopinginthe

barriers. Moreover,thiseÆienyisdiretlydependent

onthen-typeimpurityonentration. Furthersupport

forthesubstantialpreseneof holesloseto the

inter-faesisenounteredinthePLspetra.

Figure4. Shemeofthe potentialfor aQWndelta-doped

intheenterwithpdelta-dopedbarriers. Alsoinludedare

theholeprobabilitydensitiesforthedierentenergylevels.

The solid lines orrespond to the hole probability density

insidethe GaAsQW whilethe dashedlinesorrespond to

thehole probabilitydensities intheinvertedV-shaped

po-tentialintheAlGaAsbarriers. ThesubsriptsBandQW

refertothebarriersandthequantumwell, respetively.

The RT PL spetra of the nipi-MQW samples

showed no emission below thefundamental gap. The

near-edgeoptialtransitionwasafewmeV abovethat

obtained for a sample with exatly the same MQW

struture but undoped, whih was used as referene.

These results indiate that the introdution of the

delta-doping superlattie should not harm theoptial

propertiesoftheMQWstruture forusein amplitude

modulators.

PLmeasurementsasafuntionoftemperature

how-ever, revealed dierenes in the optial properties

be-tween the doped and the referene samples. Fig. 5

showshow thePL peak energy hangedwith

temper-ature for both samples. The lines are theoretial

al-ulationstobedesribedbelow. Thereferenesample,

representedbysolidirles,behavesasshouldthe

opti-al transitionorrespondingtothersteletron-heavy

holetransitionintheQW,(e1

QW -hh1

QW

),asdepited

bythedashedlineinFig.5. Forthedopedsample,the

PLspetraasafuntionoftemperatureshowthatthere

(5)

andanotheroneathigherenergywhihisonly

observ-ableathighertemperatures. Attemperaturesabove90

K, this seond emissiondominatesthe spetra. In

or-der to better understand these results, alulationsof

thetemperaturedependenteletronistruture,within

thefullk.pHamiltonianmodelwereperformed,where

atriangularpotentialmodel(Fig. 4)wasusedto

simu-latetheloalizationofthearriersineahdopedlayer,

at their nominal densities. At low temperatures

(be-low 50 K), the experimental PL results are best

de-sribedbythetransitionbetweentherstQWeletron

andtherstbarrierheavy-holelevels(e1

QW -hh1

B );the

orrespondingholeprobabilitydensitiesofthedierent

energy levels involved are depited in Fig. 4. Suh

transition isspatially indiret. Attemperaturesabove

90 K, theexperimental resultsfollowthetemperature

behavior of the transition between the rst QW

ele-tron and rst barrier light hole levels (e1

QW -lh1

QW )

whih isdiret andonly afewmeV below the(e1

QW

-hh1

QW

)transition of the equivalent undoped sample,

as illustrated in Fig. 5. Thus, around 90 K the PL

emissionsuersatransitionfromindirettodiret.

Ex-perimental support for this hange in nature is found

in the resultsof PL asa funtion of exitation power

(P). The PL peak energy of the emissionat low

tem-peraturesisblue-shiftedwithinreasingP,whihisthe

standard behavior for spatially indiret transitions 13

,

while that oftheemission athigh temperaturesis

un-aetedbyP,indiatingadirettransition. SineatRT

the(e1

QW -lh1

QW

)transitiondominates,oneonludes

that the lh1

QW

level, in the half QW, is indeed

pop-ulated, demonstrating that holes are transferred from

thebarrierintotheQWs. Asaonsequene,partofthe

transferred holes,beinglosetotheinterfaeasshown

by the probabilitydensities in Fig. 4, are mostlikely

trappedbyinterfaestates.

IV Summary

GaAs/AlGaAs MQW strutures ontaining an nipi

delta-doped superlattie were investigated in order to

evaluatetheirpotentialforuseinhighperformane

am-plitude modulators based on the QCSE. First, it has

beenshownthatitispossibletoobtainsuitableC

delta-dopedAlGaAslayerseventhoughlittleexibilityisleft

in hoosing the growth onditions for a ontrolled C

doping of AlGaAslayers. Seond, ithasbeen

demon-strated that to ahieve the required balane between

thenandptypedopinglevelsoneshould onsiderthe

existene of hole traps at the interfaes whose

ou-panydependsontheQWn-dopinglevel. Finally,PL

measurements have shown that at RT only the

near-edge emission is observed, and it is only a few meV

belowthe fundamental transitionof anequivalent

un-dopedQW,notimpairing,inpriniple,theuseofsuh

Figure 5. PL peak energy as a funtion of temperature.

Solid irlesrepresent the measurements for the referene

samplewhosebehaviorfollowtheeletron-heavyhole

tran-sitions (e1

QW Q

hh1

QW

), represented by the dotted line.

Open squares are obtained from the measurements for a

MQW struture ontaining an nipi Æ-doping superlattie

(nipi-MQW).Athightemperatures(above90K)the

exper-imentalpointsarebestdesribedbythe(e1QW Q

lh1QW)

transition,whihinvolveseletronandholelevelsinsidethe

GaAs QW (diret transition). At low temperatures, the

experimentalpoints arebestdesribedby the (e1

QW Q

hh1B) transition fromthe rst eletronlevel inthe GaAs

QWtotherstheavyhole levelintheAlGaAsbarrier

(in-direttransition). At intermediarytemperatures (50-90K)

the experimental points are desribed by the (e1

QW Q

lh1B) indiret transition whih involves the QW eletron

andthebarrierlight-holelevels. Theprobabilitydensities

forthe holes, whihpartiipate intheemissions desribed

above,areshematiallyshowninFig. 4.

Aknowledgements

This work has been partially naned by CNPq,

CAPES,FAPERJ,ERICSSONandFAPESP.

Referenes

[1℄ M. K.Chin and W. S.C. Chang, IEEE J. Quantum

Eletron.29,2476 (1993).

[2℄ T.Ido, H.Sano,D. J.Moss e H.Inoue, J.Lightwave

Tehnol.14,2324(1996).

(6)

[4℄ W. Batty andD. W. E. Allsopp,Eletron.Lett., 29,

2066(1993).

[5℄ E.F.ShubertinSemiondutores andSemimetals 40,

hapter 1,edited by A. C. Gossard, AademiPress,

NewYork(1994).

[6℄ B. Yavih,P.L. Souza, M.P.Pires,A.B.Henriques,

andL.C.D.Gonalves,Semion.Si.andTehnol.12,

481(1997).

[7℄ P.L.SouzainInPandRelatedCompounds: Materials,

AppliationsandDevies, editedbyM. O.Manasreh,

hapter6,(2000).

[8℄ B. R. Davidson, L. Hart J. , R. C. Newman, T. B.

JoyeT.J.BulloughandC.C.Button,J.ofMat.Si.:

MaterialsinEletronis7,355(1996).

[9℄ T. Makimoto and N. Kobayashi,Jpn. J. Appl. Phys.

32,L1300(1993).

[10℄ N. Kobayashi, T. Makimoto and Y. Horikishi, Appl.

Phys.Lett.50,1435 (1987).

[11℄ M. B. Johnston, M. Gal, G. Li and C. Jagadish, J.

Appl.Phys.82,5748 (1997).

[12℄ F. Brunner, T. Bergunde, E. Rihter, P. Kurpas, S.

Gramlih, I. Rehenberg, S. Kraus, M. Ahouhe,

J. Wur and M. Weyers, Proeedings of the

EW-MOVPEVIII,Prague-1999.

[13℄ Y.Gong,J.Mo,H.Yu.L.WangandG.Xia,J.Crys.

Gr.209,43, (2000).

[14℄ G.E.Hoer,H.J.Hoer,N.Holonyak,Jr.andK.C.

Hsieh,J.Appl.Phys.72,5318(1992).

[15℄ P. Abraham, M. A. Garia Perez, T. Benyattou, G.

Guillot, M. Saolotti and X.Letartre, Semiondutor

Imagem

Figure 1. Full width at half maximum (FWHM) of the a-
Figure 2. Net harge onentration as a funtion of the
Figure 3. \Lost" free holes as a funtion of the SiH4 ux.
Figure 5. PL peak energy as a funtion of temperature.

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