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Eet of DX Centers in the Vertial Transport

Properties of Semiondutor Superlatties

F. Aristone y

,B. Goutiers z

,J. L. GauÆer z

, and L.Dmowski {

y

DFI-CCET/UFMS,C.P.549, 79070-900CampoGrande -MSBrazil

z

INSA-ComplexeSientiquedeRangueil,31077 Toulouse,Frane

{High Pressure ResearhCenter,01-142Warsaw,Poland

Reeived27September,1999

DXentershavebeendetetedinvertial transportexperimentsofGaAs-AlAssuperlatties. We

studiedminibandondutionpropertiesofsuhsemiondutorstruturesinpreseneofhigh

hydro-statipressuresandontrolledtemperature.Hystheresiseetintheurrent-voltageharateristis

wasobserved. Weshowthatminibandtransportpropertiesaredependentonthepathofthe

pres-sureyleimposedto the sample. It islear from ourresults thatDX entersare present inthe

ativesuperlattieregion. Wepropose that the energyassoiated with DXstatesinsuperlattie

resultsfroma\hybridization"ofDXentersofbothGaAsandAlAsbulkmaterials.

Semiondutor superlatties are very attrative

strutures for use in the design of eletroni

de-vies, partiularlyinhigh frequenyosillators usedin

teleommuniationsystems[1℄. Bulk-likenegative

dif-ferentialondutanehas beendemonstrated in

verti-al transport ofsuperlatties. Eletronsmovingalong

growthaxisdiretionaresubjettohighminiband

non-paraboliity and onsequently undergo negative

ee-tivemassatsuÆientlyhighbiasvoltage[2℄.

Band struture of superlatties is more omplex

than band struture of bulk materials due to the

additional periodiity introdued when growing

dif-ferent semiondutors alternately. It is known that

Al

x Ga

1 x

As materials present two minima along the

[001℄ diretion, the and X point usually alled

and X valleys [3℄. GaAs has the lowest minimum at

the valley, whih denotes a diret band-gap

mate-rial. AlAs is an indiret band-gap material beause

itslowest minimumisloated atX. Valley mixingon

theGaAs AlAssuperlattieinterfaeswasstudiedby

Ando[4℄.

Condution (mini)band struture of superlatties

and bulk materials present analogies, sine the

peri-odi prolesof and X valleys produe the so-alled

\diret"and \indiret"minibands, respetively [5℄. A

superlattie issaidto be\diret"whenthehigher

en-ergyvaluefor minibandis lowerthanthelowest

en-ergy for any X miniband. Relative position of and

ters. Symmetri\indiret"GaAs AlAssuperlatties

are obtainedwhen well and barrier thikness are less

than 13 mono-layers [6℄. There are two dierent X

minibands assoiatedwith longitudinaland transverse

(two-folddegenerate)eetivemasses.

Shallowanddeeplevelsarealsopresentintheband

struture of Al

x Ga

1 x

As materials when the whole

struture isdoped,e.g.,withsilion. Suh statesarise

from the same donor enter and are separated by an

energy barrier. Shallow levels are explained in terms

of eetive mass state and deep levels are assoiated

with relaxed donors. Deep donorlevels arealled DX

statesandhavebeenobservedinIII-Vsemiondutors.

Inthis paperwedemonstratethepreseneofDX

en-tersinsuperlattiestruturesusingavertialtransport

experiment.

Hydrostati pressure is frequently used as a very

funtional tool to explore band struture in

semion-dutors. Pressure eets in superlatties are more

ompliated to analyze than they are in bulk

materi-als. Leburton and Kahen studied the pressure

oef-ient dierene of band energy for both bulk

mate-rials and superlatties [7℄. Warburton et al.

inves-tigated the pressure oeÆient of eetive mass for

GaAs Al

x Ga

1 x

As heterojuntions and found the

samevalueasfoundin bulkmaterials,with no

depen-dene on theeletron onentrationn [8℄. Austing et

(2)

X eletroni intervalley transfer in GaAs

Al

x Ga

1 x

As superlatties hasbeendisussed by

vari-ousauthors,eitherinvertialorparalleltransport

on-guration. Dutisseuil et al. analyzed intra-miniband

heatingandintervalleysatteringapplying

hydrostati-pressureonsuperlatties[10℄. Nunnenkamp etal.

per-formed time-resolved optial measurements to study

transitionoftype-Itotype-IIGaAs AlAssuperlattie

underpressure[11℄. X mixinginGaAs AlAshas

also beenstudied withthe help ofamagneti eld by

Pulsford et al.[12℄. Sellito et al. reentlypresenteda

study of DX statesin planardopedGaAs AlAs

su-perlatties [13℄. Measuring Hall and photo-Hall eet

of uniformand delta-doped superlatties, theyshowed

two main eets of suh eletroni struture behavior

under hydrostati pressure: 1) miniband rosses over

thedeeplevelwhenhighenoughpressureisapplied;2)

shallowlevelsarelinkedtotheminiband.

Eetsofhydrostatipressureonvertialtransport

propertiesfor\diret"and\indiret"GaAs AlAs

su-perlattieshavealsobeenstudied. Appliationofhigh

pressureallowsexpliitseparationofGaAs AlAs

su-perlattie eletroni transport. Transition from

\di-ret" to \indiret" superlattie strutures has been

demonstrated when suÆiently high hydrostati

pres-sure is applied to the sample [14℄. In this paper we

presenttherstevideneto ourknowledgeofDX

en-ter eetonperpendiulartransportofsuperlatties.

Oursamplesweregrownbymoleularbeamepitaxy

onan +

-doped[001℄orientedGaAssubstrate. The

pe-riod of sample1wasequalto 74

A; of whih 54

A was

thewelland20

Athebarrier.First miniband

ondu-tionforthisstruturewas9meV wideandseparatedby

102meV from the bottom of GaAs ondution band.

It is a diret struture (type-I) for whih the rst X

miniband was62meV above miniband. Theperiod

of sample 2 wasequal to 34

A; of whih 20

A wasthe

welland14

A thebarrier. An indiretstruture

(type-II), itsrstX minibandwas6meV wideseparatedby

80meV from the bottom of GaAs ondution band.

A grading average of theomposition wasarried out

betweensuperlattie ativeregion anddoped layersin

ordertoavoidabruptheterojuntionsinthepassageof

thethree-dimensionaleletrongasfromontatstothe

miniband.

Conventional lithographiproesseswereemployed

toobtainmesa-areatypiallyintherangefrom100m 2

to 2800m 2

. AuGeNi was deposited and diused on

bothtopandbottomn +

-dopedlayers,thusgiving

per-fetOhmiontatsforoursamples. Theativeregions

were lightly doped, with a Si onentration of n

210 16

m 3

forsample1andn 110 16

m 3

for

Ourresultswereobtainedusingstandardtransport

tehnique. All measurementswere performed in total

abseneoflight. Hydrostatipressurewasappliedusing

either aliquidlampelloraHelium gasompressor.

Pressureinsidetheellwasmeasuredwithaalibrated

InSb resistane.

Typial urrent-voltage I(V) harateristis were

obtainedasafuntionofappliedpressureatroom

tem-peratureandatT =77K,forourtwosamples. These

resultsaninarstapproximationbeexplainedasthe

intervalley eletroni transfer, sine hydrostati

pres-sure produes a relative movement of minibands, as

disussedbyGassot etal.[15℄

However, rigorousobservation of I(V)

harateris-tis,inpartiular for\indiret"sample, indiatesthat

more preise arguments are neessary to explain our

data. We plot in Fig. 1 I(V) harateristis for

dierent temperatures, obtained at onstant pressure

P=12kbar. Theurrentintensitydereases

monoton-iallyasthetemperaturedereases. Suhadereasein

urrentannotbeexplainedasintervalleytransfer,

be-ausethis sampleisalready \indiret"at atmospheri

pressure. Therefore itis evidentthat no eletronsare

present in the miniband at high pressure, even at

roomtemperature.

Figure 1. I(V) harateristis at onstant pressure P =

12 kbars for \indiret" sample 2. Two dierent

temper-atures are shown. Dashed urve has been multiplied by

fator50, toappearinthesamesale. Dereaseinurrent

intensityisexplainedaseletrontrappingbyDX enters.

Toexplainthis eetweneedto onsiderthe

pres-eneofreombinationentersinthesuperlattie

stru-ture. Currentintensitydereasesbeauseeletrons

re-main onned to trapping states when temperature

goes down. We an also infer that the pressure

oef-ientofthis reombinationenterisverylosetothe

(3)

our struture, we performed a \yle of pressure"

ex-periment, whih is divided in two parts as desribed

below:

First Part SeondPart

i) I

1

(V) harateristi is measured at room

tem-peratureT

r

=300K;

I) I

4

(V) harateristi is measured at room

tem-peratureT

r

=300K;

ii)sampleisooledtoT

n

=77K;I

2

(V)

harater-istiismeasured;

II) Pressureisapplied uptoP

m

=12kbars,while

temperature T

r

= 300K is kept onstant; I

5 (V)

harateristiismeasured;

iii) sampleisheated toT

r

=300K; I

3

(V)

hara-teristiismeasured.

III) temperatureis ooledto T

n

=77K and

pres-sureP

m

= 12kbars is maintenedonstant; I

6 (V)

harateristiismeasured;

IV) pressureis ompletely relaxed with

tempera-ture T

n

= 77K onstant; I

7

(V) harateristi is

measured;

V)sampleis heatedto T

r

=300K; I

8

(V)

hara-teristiismeasured.

Suh ayleisshematiallyrepresentedonP T

diagramofFig. 2. I

1 (V),I

3 (V),I

4

(V)andI

8

(V)

har-ateristis were measured (on position R of Fig. 2)

todeterminewhetherirreversibledeformationourred

in the sampleornot. No variationhas been observed

among all these harateristis, insuringthat intrinsi

eletronipropertiesofsuperlattiewerepreserved

dur-ingtheproess.

Figure2. Shematirepresentationofthe\pressure yle"

experiment. Vertial transport properties of GaAs-AlAs

superlatties weremeasured duringthe yle. Results

ob-tained at position R ertify that hydrostati pressure did

notdamagethesample. WeomparedI(V)harateristis

atpointO fortwodierentpathsandhystheresisbehavior

wasobserved.

point O dueto preseneofDX entersin superlattie

struture. We ompare I

2

(V) and I

7

(V)

harateris-tis that were obtained both at atmospheri pressure

andat T =77K,but measuredattheendofdierent

pathsonthe\yleofpressure". Hystheresisbehavior

observedforsample1isexhibitedinFig.3. Thiseet

is also diret evidene for thepresene of DX enters

in thesuperlattiestruture.

Figure3. I(V)harateristisobtainedforsample1atpoint

O ofthe\pressureyle" experiment,whihis represented

inFig. 2anddesribedinthetext. Hystheresisbehavioris

duetotrapping of eletronsduetoDX enters present in

theativeregionofsuperlattie.

Hydrostatipressurewasappliedatroom

tempera-tureanddue to highthermalenergyeletronsare

dis-tributed among and X minibands anddeep enters.

Whentemperaturedereasesatonstantpressure,less

eletronshaveenergytoaessthehigh miniband. At

T =77K nomoreeletronsarepresentin miniband.

(4)

re-moreeletronshaveaesseither to X miniband orto

DXstates. Someeletrons,however,remainedtrapped

in DX states due to lowthermal energy. Hystheresis

eetisobservedbetweenthesetwopartiular

measure-mentsofI(V)harateristis. PreseneofDX enters

in thesuperlattie strutureisthereforemadeevident.

We estimate the energy position, entropy fator

and pressure oeÆient of this energy trapping level,

based on the Theis [16℄ and Adahi [17℄ desription

of DX enter. We onluded for sample 2 that: 1)

a DX-type reombination enter is loated

approxi-mately 100meV below the miniband X; 2) the

en-tropyfator is S 0:2meV=K; 3) its pressure

o-eÆientislose to pressureoeÆientof miniband X,

roughlyequalto10meV=kbar. Wealsoalulated

dop-ingonentrationintheativestrutureand wefound

N

d

0:810 16

m 3

,whihisinsubstantialagreement

with growthparameters. Results forsample 1leadto

equalentropyfatorand pressureoeÆient. We

esti-mateinthisasethataDXlevelisloatedat120meV

belowtheX miniband.

We have haraterized, therefore, a reombination

state in our strutures for whih the pressure

oeÆ-ient, entropy fatorand energy position areidential

to bulkDX 0

\relaxation level" values. The \yleof

pressure"expressesthissamebehavior,i.e.,hystheresis

observedidentiesalattierelaxationlevel.

Inonlusion,wedemonstratedthepreseneofdeep

levelsinGaAs=AlAssuperlattiesusingvertial

trans-port experimentsin preseneof highhydrostati

pres-sure. Twoprinipaleets wereobserved: dereaseof

urrent intensity as a funtion of temperature for

in-diret samplesand hystheresis behavior signifying the

presene ofaDX level. Afterdetermination ofenergy

position,pressureoeÆientandentropyfatorwe

as-soiated suh astate with aDX 0

level. We proposed

thepreseneofreombinationlevelinsuperlattiesdue

to \hybridization" of DX enters of both GaAs and

AlAs materials.

Aknowledgments

WeexpressspeialgratitudetoJ.F.PalmierandJ.-C.

Portalforaritialreadingofthispaper. We

aknowl-for tehnial support. One of us (F. A.) is

partiu-larlygratefultoCNPq-Brasilfornanialsupport. We

arefullyaknowledgethesamplesprovidedby

Frane-Teleom/CNET.

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[1℄ M.Hadjazi,J.F.Palmier,A.Sibille,H.Wang,E.Paris

andF.Mollot.EletronisLetters29,8:684 (1993).

[2℄ A.Sibille,J.F.Palmier,H.WangandF.Mollot. Phys.

Rev.Lett.64,52(1990).

[3℄ M.GuzziandJ.L.Staehli. SolidStatePhenomena10,

25(1989).

[4℄ T.Ando. Phys.Rev.B47,9621 (1993).

[5℄ O.E.Raihev. Sov.Phys.Semiond.25,740(1991).

[6℄ K.Reimann. Jpn.J.ofAppl.Phys.32,64(1993).

[7℄ J.P.Leburtonand K.Kahen. Superlatt.Mirostrut.

1,49(1985).

[8℄ R.J.Warburton,M.Watts,R.J.Niholas,J.J.Harris

andC.T.Foxon. Semiond.Si.Tehnol.7,787(1992).

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Huthinson, G. W. Smith, J. S. Roberts and G. Hill.

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[10℄ E.Dutisseuil,A.Sibille, J.F.Palmier,F.Aristone,F.

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[11℄ J.Nunnenkamp, K.Reimann,J. Kuhland K.Ploog.

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[12℄ N.J.Pulsford,R.J.Niholas,P.Dawson,K.J.Moore,

G.Duggan, and C.T.B.Foxon. Phys.Rev.Lett. 63,

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[13℄ P.Sellito,J.Siart,J.L.RobertandR.Planel. Phys.

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C.Portal and F.Mollot. Jpn.J. Appl. Phys. 32,144

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(1988). E. Calleja, A. Gomez and E. Mu~noz. Appl.

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Imagem

Figure 1. I(V ) harateristis at onstant pressure P =
Figure 3. I(V ) harateristis obtained for sample 1 at point

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