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Multihannel Photomultiplier for Multipass

Thomson Sattering Diagnostis

M.J. R. Monteiro, M. Mahida, A. M.Daltrini,and L. A. Berni 1

InstitutodeFsia\GlebWataghin", UniversidadeEstadualde Campinas,

C.P.6165,13083-970, Campinas,SP,Brazil

1

LAP/INPE-S~aoJose dosCampos,SP,Brazil

Reeivedon26June,2001

Theappliationofanewmultihannel64parallelampliation10stagephotomultiplierarranged

in8x8matrixof 20.32mmx20.32 mm,detetorXP1752fromPhilips, for laserlight sattering

diagnostis is now under development. Signal intensity alibration urve for eight parallel and

individualhannels,aswellasrosstalkbetweenhannelswasmeasured. Also,Rayleighsattering

onnitrogen gas, normally used as optialalibration method for eletron density measurements

in Thomson sattering was realized, and the intensity of both detetors was ompared making

measurementswithatungstenlamp.

I Introdution

Thomsonsatteringisoftenusedtomeasurethe

lo-aleletrontemperature,[1,2℄andeletrondensityan

bedeterminedifalibrationisdonebyuseofRayleigh

sattering [3,4℄. For this diagnosti method, one of

theritialissuesistheverylowsatteredlightsignal,

whihanbeinreased byuse ofa higherlaser power

orby passingthelaser beammany timesthroughthe

sameregionin theplasma,knownasmultipasssystem

[5-7℄.

Inour experiments, we use a 3J ruby laser, 40 ns

pulse width, and a multipass onguration with one

lensand twoonentrialspherialmirrorsto inrease

theinidentpowerand,onsequently,thesattered

sig-nal.

Throughthewidth ofthis Thomsonsattered

pro-le, we an measure the eletron temperature. But,

when asingle photomultiplier is used, oneneedmany

pulses of the laser beam as well as many disharges

ofourtokamakNOVA-UNICAMP[8℄,loosingtherefore

quiknessandaurayin ourmeasurements.

So,the purpose to usea multihannel

photomulti-plierinThomsonsatteringistoallowonline

measure-mentoftheeletrontemperatureanddensity,withone

shotof the laser beamand onedisharge of the

toka-mak.

Also,weanobtainradialinformation,thoughthe

spatial resolution of the detetor, improvingtherefore

theaurayinthemeasurementsandknowledgeofthe

II Experimental setup

Figure1. Experimentalsetup.

InFig. 1,weansee theexperimental setupused

for our measurements. The laser beam, after many

passages through the entral region, it is olleted in

abeamdump. Forthealignment,weused twoHe-Ne

(2)

Thespetrometer SPEXhas 75 m foal distane,

11

A/mmdispersionrelation,andpermitstousetwo

detetors. Byrotationof ainternal mirrorwean

se-let, thesinglehannel detetor, photomultiplier RCA

7265,orthemultihannelphotomultiplier,XP 1752.

Eah hannel of XP1752 detetor has 2.54 mm x

2.54mmofsensitivearea,spetralresolutionof

approx-imately 27

A, 5.0 ns response time, 10 stage dynodes

with gainof1x106at1150V, andallowstomeasure

FWHMof Gaussianshapesatteredlightfrom8nm(

6eV)to 80nm(600eV).

The single hannel photomultiplier has a response

timeof3.5ns,14stagedynodes,andgainof2x10 6

at

1800V.

Thesignalsfromthedetetoristakenbyanalogto

digitalonverters,ADC, LeCroy2249Aandontrolled

withGPIBtoaPC,providingonlinemeasurementsof

satteredlightvariationbywavelengths.

III Results

The64hannelshavebeensetto8parallelolumn

out-puts. Eah olumn outputoversall spetrometer slit

height,andonespetralwidth of27

A.Signalintensity

alibration urves for this eight parallel hannels was

measured,in therangeof620nmto 642nm,sanning

aHe-Nelaser,Fig. 2.

Figure2.Intensityalibrationurvesofthe8parallel

spe-tralhannels,1to8,fromrighttoleft,ofthemultihannel

detetorXP1752.

The ross talk between hannels is dened as the

inuene of signal in one hannel aused by adjaent

hannel. If we observe the right and left sides of the

Fig. 2, olumn hannels 1 and 8 respetively, we see

thatthestraightlineatthebottomofsignalsisdueto

the lakofadjaent hannels. So, theinuene ofone

hannel on theadjaenthannel appears as thesmall

area surrounding the harateristi area of the signal

in the hannel. So,theross talk isthe ratiobetween

theareasoftheinuenesignal,A1,andharateristi

Figure3.Crosstalkausedinthehannel4bythehannel

5.

Measurements using He-Ne laser, slit aperture of

100mm,showthat themeanrosstalk between

han-nelisabout14%.

Formorepreiseharaterizationofthe

multihan-nel photomultiplier, intensity alibration of the64

in-dividualhannelswasalsomeasured,Fig. 4.

InFig. 4,eahspetralhannelhas27

Aresolution

andeahspatialhannelovers2.5mmslitheightwith

100mm slit aperture of the spetrometer. We notie

that there is 5.4 intensity variation between hannel

(4,5)andhannel(1,8)whihisinaordanetoother

measurements[9,10℄.

Figure4.Intensityalibrationforthe64individualhannels

ofthemultihannelphotomultiplierXP1752.

(3)

def-individualdetetors inthespetralhannel4,as

fun-tionof theslit height,Fig. 5. Again,weuseaHe-Ne

laserand theslitapertureof100mm. Notie thatfor

fullslitheightopening2.5x8,wereproduethe

spe-tralhannel4ofgure4.

Figure5. Intensityvariationofthespetralhannel-4eight

detetorasfuntionoftheslitheight.

Rayleighsatteringmeasurementson nitrogengas,

normally used as optial alibration method for

ele-trondensitymeasurementsinThomsonsattering,was

donetotestthemultihanneldetetor,Fig.6.

Figure 6. Calibration urvefor Rayleighsattering on

ni-trogengasusingonespetralolumnhannel(hannel6)of

themultihannelphotomultiplier.

As we an see, the approximatelylinear variation

ofthe signalswith thepressureis harateristiofthe

alibrationurveforRayleighsattering.

Finally,usingatungstenlampandthesame

exper-imental set up,wemeasure theintensities ratioofthe

signals at harateristi values of working voltage for

single(1800V)andmultihanneldetetor(4,5)(1400V)

Figure7.Intensitymeasurementsforsingleand

multihan-nelphotomultipliersusingatungstenlamp,notiethatthe

ratioisaboutvetimes.

IV Conlusions

CharaterizationofthemultihanneldetetorXP1752

hasbeendonewiththepurposeofuseonThomson

sat-teringmeasurements. Thisdetetorprovidesboth

spe-tralandspatialresolutions,andsamerangeofintensity

ompared tosinglephotomultiplier,whihshould

on-tributetoaurayandquiknessontheloaleletron

temperatureanddensitymeasurements.

Aknowledgements

The authors would like to thank FAPESP and

FINEPforthenanialsupport.

Referenes

[1℄ M.Bassan,R.Bilato,L.Giudiotti,R.Pasqualoto,and

A.Sardella,Rev.Si.Instrum.68,718(1997).

[2℄ A. Cte, D. Mihaud, N. Rihard, R. Neufeld, and

C.Legros,Rev.Si.Instrum.66,487(1995).

[3℄ L.A.Berni,D.O.Campos,M.Mahida,S.A.

Moshka-lyov andS.V. Lebedev; Brazilian Journalof Physis,

26,755(1996).

[4℄ D.G.Nilson,D.N.Hill,J.C.Evans,T.N.Calrstrom,

C.L.HsiehandR.E.Stokdale;Rev.Si.Instrum.68,

704(1997).

[5℄ M. Yu. Kantor and D. V. Kouprienko; Rev.Si.

In-strum.70,780(1999).

[6℄ M. Yu. Kantor; Tehnial Physis Letters, 23, 671

(1997).

[7℄ M. Yu. Kantor; Tehnial Physis Letters, 25, 860

(1999).

[8℄ M. Fukao, K.Mori, T.Tanihara; PlasmaPhys.

Con-trol.Fusion,33,199(1991).

[9℄ J.P.Boutot,P.LavouteandG.Eshard;IEEETrans.

Nul.Si.,34,449(1987).

[10℄ L. Eriksson et al.; IEEE Trans. Nul. Si., 34, 344

Imagem

Figure 1. Experimental set up.
Figure 2. Intensity alibration urves of the 8 parallel spe-
Figure 5. Intensity variation of the spetral hannel-4 eight

Referências

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